About Event

Event Date : 21 Jul 2020 | Tue | Time : 01.00 PM to 02.00 PM

Test Vision Symposium Program of SEMICON West 2020

Session Topic: Democratizing Deep Learning to Accelerate Image-Based Defect Inspection


Quest speakers will discuss the application of artificial intelligence (AI) and defect inspection techniques in the semiconductor manufacturing world. We will also present our deep learning accelerator tool and explain how it can enhance productivity. View Recording

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Quest provides integrated & comprehensive engineering solutions that are designed to semiconductor equipment OEMs’ complex and ever-changing needs. We deliver impactful results with our capability in turnkey product development, creating enterprise solutions, enabling manufacturing and creating innovative digital solutions across all front end, back end and SMT equipment.

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